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SAA-HPI-SSScanAsyst Air HPI Super Sharp Probes, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS New super sharp probes for highest resolution imaging in air on the widest sample range. Optimized for PeakForce Tapping operation in air. Recommended for use with any PeakForce Tapping enabled Bruker AFM. Combines a tip with 1 nm nominal end radius and moderate 0. 25 N m spring constant for reliable highest resolution imaging on any sample,

Mica Sample

Recommended for use with any PeakForce tapping enabled Bruker AFM

the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants

***Note: Bruker's new MESP-HM-V2 probe replaces the legacy MESP-HM probe

The coating on the back side of the cantilever enhances laser reflectivity

Innova probe cartridge for TappingMode DESCRIPTION

180nm step height

The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2

Max W = 32 nm

The imec CAMS resolution qualification structures consist of a thin uniform layer of SiO2 confined between highly-doped grown poly-Si and implanted Si

A pack of 10 High quality etched silicon probes for hard TappingMode™ and other non-contact modes

Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air

Exchange/Return Notes